When Exposed to IoT, Big Iron ATE Will Rust

For the testing challenges of tomorrow, traditional ATE falls short. Test engineers need smart ATE for the smart devices of the IoT.

Smarter ATE enables test engineers to:

  • anticipate and economically incorporate technology advances into their test systems 
  • use an open-platform of modular hardware and scalable software.

Also included in the download is a case study showing how IDT reduced the costs of “big-iron ATE” through trial and error by first building their own systems and then looking to a modular solution.

Please note that a valid email address is required to receive this white paper.

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